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1
Semiconductor material and device characterization_Solution manual
Wiley-IEEE Press
Dieter K. Schroder
slope
versus
square
resistance
intercept
exp
determine
capacitance
voltage
device
equation
layer
nkt
5x10
current
idv
leading
3x10
junction
2.3nkt
300k
density
diode
doping
increases
linear
ohms
schottky
semiconductor
solving
vps
1.73x10
2x10
cox
oxide
probe
values
210k
7.85x10
axis
biased
calculate
characterization
choose
cins
contacts
deviation
fav
interc
measured
Year:
2006
Language:
english
File:
PDF, 13.25 MB
Your tags:
0
/
0
english, 2006
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